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First Pass 90nm Silicon Success
Multi-media Processor
Huge Cost Reduction on PCM Chip
Low Power Design
12 Million Gate Count Design
Optical Shrink Technology
WCDMA Base Station
ESD Production

 

Success Story: First Pass 90nm Silicon Success

Chip Function  
Mobile media processor application
 
Design Summary
  • Technology: UMC 90nm + 1 poly 7 layer metals
  • Gate counts: 400K + 15 Macros
  • Frequency: 100MHz
  • Die size: 4x4 mm^2
Design Challenges
  • OCV checking and optimization
  • Timing optimization on six operating modes over five corner RCs
  • Dense end-of-line routing
  • Low power design approach
  • DFM rule handing

EE Solutions successfully tape-out this mobile media processor for a fables company in Taiwan. EE Solutions implemented the Deep Submicron Design flow to tape-out this 90nm complex design within 7 weeks and it is first pass silicon success approved by customer.