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Test Development
EE Solutions provides test planning and strategies for digital, analog and memory blocks and work with customers to select the right test platforms to optimize costs. Our engineers have extensive experience with top tier testing firms in Taiwan. We design load boards and probe cards and provide test program development for all major platforms (Agilent, Credence, Advantest, Schlumberger and Teradyne). We have proprietary test pattern conversion tools support all the major platforms. EE Solutions experienced engineers determine the most cost effective production tester based on the required pin count, speed, and nature of the design. All our testing partners are located in Taiwan and have relationships with ASE, VATE, Kyocera and close proximity of these vendors makes it efficient to resolve issues.
Provided variable platform to meet :

Success Cases
| Application |
Package Type |
Challenge/Character |
Tester |
| Analog AFE |
TQFP100 |
Complicated Analog Circuit |
Schlumberger EXA9000 |
Communication
4CDSP |
LQFP64 |
Analog Circuit
Parallel Testing
(cost down version) |
Teradyne Catalyst |
Communication
Controller-WCDMA |
PBGA |
Digital Circuit
High Pin Count |
Agilent 83K |
Communication
Controller-WCDMA |
HSBGA |
Digital Circuit
High Pin Count |
Agilent 83K |
| System Controller |
CSBGA |
Digital Circuit
High Pin Count
(cost down version) |
Teradyne J750 |
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